METHOD FOR CHEMICAL DEPOSITION OF THIN SILICON-DIOXIDE FILMS Russian patent published in 1998 - IPC

Abstract RU 2119692 C1

FIELD: microelectronics; manufacture of multilayer very large- scale integrated circuits. SUBSTANCE: method involves oxidation reaction of silicon hydrides under flow conditions at low pressure with inflammation region extended towards lower temperatures (down to 35 C) and pressures using chemically active material such as long-living intermediate product of oxidation reaction proper, dichlorosilane being used as fuel. EFFECT: reduced deposition temperature of thin uniform films homogeneous and stoichiometric in their composition. 3 dwg

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RU 2 119 692 C1

Authors

Rubtsov N.M.

Tsvetkov G.I.

Dates

1998-09-27Published

1996-03-15Filed