SEMICONDUCTOR DEVICE AND ITS MANUFACTURING PROCESS (VERSIONS) Russian patent published in 1999 - IPC

Abstract RU 2127005 C1

FIELD: semiconductor engineering. SUBSTANCE: device has ferroelectric capacitor obtained by means of process given in description of invention; gasket made of low dielectric constant material is formed on surfaces of sides of set of bottom electrodes assembled in separate cellular blocks; ferroelectric film is formed on bottom electrodes whereon there is gasket made of low dielectric constant material; top electrode is formed on ferroelectric film. EFFECT: provision for preventing breakdown between adjacent bottom electrodes. 6 cl, 13 dwg

Similar patents RU2127005C1

Title Year Author Number
METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE PROVIDED WITH SELF-ALIGNED CONTACT 1997
  • Ban Khio-Dong
  • Choe Khjun-Cheol
  • Choj Chang-Sik
RU2190897C2
SEMICONDUCTOR MEMORY DEVICE WITH CAPACITORS FORMED ABOVE AND BELOW MEMORY LOCATION TRANSISTOR (ALTERNATIVES) AND ITS MANUFACTURING PROCESS 1995
  • Li Dzhoo Jang
RU2194338C2
SEMICONDUCTOR STORAGE DEVICE AND ITS MANUFACTURING PROCESS 1990
  • Seong-Tae Kim
  • Kijung-Khan Kim
  • Dza-Khong Ko
  • Su-Khan Choj
RU2127928C1
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE 1997
  • Li Dzho-Jang
  • Kim Ki-Nam
RU2176423C2
METHOD FOR PRODUCING SEMICONDUCTOR MEMORY DEVICE (ALTERNATIVES) AND SEMICONDUCTOR MEMORY DEVICE 1998
  • Park Jung-Vu
  • Nokh Dzun-Jong
  • Koo Bon-Jung
  • Kang Chang-Dzin
  • Dzung Chul
  • Nam Seok-Vu
RU2234763C2
OHMIC CONTACT STRUCTURE OF SEMICONDUCTOR DEVICE AND PROCESS OF ITS MANUFACTURE 1994
  • Sangin Li
  • Soonokh Park
RU2155417C2
MASK (VERSIONS) AND PROCESS OF ITS MANUFACTURE (VERSIONS) 1994
  • Vu-Sung Khan
  • Chang-Dzhin Son
RU2144689C1
METHOD FOR PRODUCING INTEGRATED-CIRCUIT CAPACITOR HAVING IMPROVED CHARACTERISTICS OF ELECTRODE AND INSULATING LAYERS (ALTERNATIVES) AND CAPACITORS PRODUCED BY THIS METHOD 1998
  • Li Seung-Khvan
  • Li Sang-Khiop
  • Kim Jung-Sung
  • Shim Se Dzin
  • Dzin Ju-Chan
  • Mon Dzu-Tae
  • Choj Dzin-Seok
  • Kim Jung-Min
  • Kim Kiung-Khon
  • Nam Kab-Dzin
  • Park Jung-Vok
  • Von Seok-Dzun
  • Kim Jung-Dae
RU2199168C2
HIGH-SPEED AND HIGH-CAPACITY MOS TRANSISTOR AND ITS MANUFACTURING PROCESS 1998
  • Kim Khjun-Sik
  • Sin Kheon-Jong
  • Li Soo-Cheol
RU2197769C2
VOLTAGE AMPLIFYING CIRCUIT FOR SEMICONDUCTOR STORAGE DEVICE 1994
  • Khun Choj
RU2138085C1

RU 2 127 005 C1

Authors

Ki-Von Kvon

Chang-Seok Kang

Dates

1999-02-27Published

1994-01-25Filed