METHOD FOR DETECTING STRUCTURAL DEFECTS IN SINGLE CHIPS Russian patent published in 2000 - IPC

Abstract RU 2151445 C1

FIELD: digital semiconductor devices and integrated circuits. SUBSTANCE: chip is deformed by applying mechanical load, then subjected to chemical etching with solution selectively acting on defects; prior to etching, chip is deformed by its ultrasonic treatment in chemically inactive liquid at 20-40 kHz for 10-30 min. EFFECT: improved sensitivity of selective chemical treatment to structural defects in chips. 2 tbl, 2 ex

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RU 2 151 445 C1

Authors

Skupov V.D.

Smolin V.K.

Kormishina Zh.A.

Dates

2000-06-20Published

1998-04-30Filed