FIELD: microelectronics, manufacture of plates from monocrystalline silicon with gettering layers. SUBSTANCE: surfaces of working and nonworking sides of substrate are worked mechanically and chemically then three-stage annealing is performed at high and low temperatures to form internal gettering layer. Working sides of substrates are irradiated with flux of alpha particles from radionuclide source before second low- temperature stage of annealing. Change of period of crystal lattice in surface layers close to nonworking sides of substrates is recorded and irradiation is discontinued after stabilization of period of lattice. EFFECT: facilitated preparation of plates. 1 tbl
Title | Year | Author | Number |
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PROCESS OF GETTERING WORKING OF SILICON SUBSTRATES | 1997 |
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RU2134467C1 |
METHOD FOR PROCESSING OF SILICON SUBSTRATES | 1996 |
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METHOD FOR TREATMENT OF SINGLE-CRYSTALLINE SILICON PLATES | 1996 |
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METHOD FOR PROCESSING OF SILICON PLATES | 1996 |
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METHOD FOR GETTER TREATMENT OF SEMICONDUCTOR PLATES | 1998 |
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METHOD FOR CARRYING OUT GETTERING TREATMENT OF EPITAXIAL LAYERS OF SEMICONDUCTOR STRUCTURES | 1999 |
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SILICON SUBSTRATE TREATMENT PROCESS | 1997 |
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METHOD FOR PRODUCING SILICON-ON-INSULATOR STRUCTURES | 1998 |
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PROCESS OF GETTERING TREATMENT OF SEMICONDUCTOR PLATES | 2001 |
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SILICON-ON-INSULATOR STRUCTURE MANUFACTURING PROCESS | 2000 |
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RU2193256C2 |
Authors
Dates
1998-04-27—Published
1996-05-13—Filed