SILICON NANOSTRUCTURE PRODUCTION PROCESS Russian patent published in 2000 - IPC

Abstract RU 2153208 C1

FIELD: structures for data transmission, conversion, storage, and generation. SUBSTANCE: process includes physical and chemical procedures acting on silicon-containing material followed by settling of silicon due to mentioned action in nanocavities of porous silicate matrix. Novelty is that matrix proper is exposed to electron flow at energy of 5-25 keV and density of 1-102 mA/sq.mm for at least 50 s. Opal matrix may be used for the purpose. Electron flow may be obtained by scanning electron beam over substrate surface at low pressure, say, 10-5-10-6 mm Hg. EFFECT: provision for shaping local silicon areas of different thickness and configuration. 5 cl, 1 tbl

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RU 2 153 208 C1

Authors

Bogomolov V.N.

Zamorjanskaja M.V.

Sokolov V.I.

Dates

2000-07-20Published

1999-07-21Filed