METHOD AND DEVICE FOR PRODUCING THIN SEMICONDUCTOR FILM Russian patent published in 2002 - IPC

Abstract RU 2189663 C2

FIELD: microelectronics. SUBSTANCE: method includes introduction of source gas into vacuum chamber and its decomposition using inductively coupled high-frequency plasma generated due to high-frequency energy supply and deposition of desired thin semiconductor film on substrate by chemical evaporation of steam using decomposed source gas wherein crystallization conditions for thin semiconductor film being deposited are controlled by controlling heating temperature of substrate in the course of film deposition process. Device implementing proposed method has means providing for controlled deposition of film. EFFECT: enhanced quality of thin semiconductor film obtained at low temperature with adequate control of crystallization process. 22 cl, 6 dwg

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RU 2 189 663 C2

Authors

Kitagava Masatoshi

Joshida Akikhisa

Shibuja Munekhiro

Sugai Khideo

Dates

2002-09-20Published

1998-06-29Filed