FIELD: diagnostics of reliability of lots of devices. SUBSTANCE: invention deals with comparative evaluation of reliability of lot of instrument both in production and usage. Lot of transistors is tested for electrostatic discharge. Electrostatic discharges with potential twice as great as technically permissible is supplied to selected transistors and raised in steps by 20-30 V till parametrical or catastrophic failures emerge, then conclusion on reliability of lot is made in correspondence with criterion of rejection. EFFECT: no need in usage of special equipment and heating in process of comparative evaluation. 2 tbl
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