PROCEDURE ESTABLISHING POTENTIALLY UNRELIABLE SEMICONDUCTOR DEVICES Russian patent published in 2004 - IPC

Abstract RU 2230335 C1

FIELD: electrical engineering. SUBSTANCE: procedure comprises measurements of noise intensity under operational mode before electrostatic discharge, after exposure to action of electrostatic discharge and after firing. Value of electrostatic discharge is 20-30% higher than value of discharge permissible by specifications. Thermal firing is conducted at temperature 100-125 C in the course of 2-4 h. Batch of devices of enhanced operational reliability is sorted out depending on value of restoration of noise values after firing. EFFECT: enhanced authenticity and widened functional possibilities of procedure. 2 tbl

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RU 2 230 335 C1

Authors

Gorlov M.I.

Zharkikh A.P.

Dates

2004-06-10Published

2002-10-21Filed