FIELD: electricity.
SUBSTANCE: on identical samples from compared batches of transistors, intensity of noise is measured in different transitions after fourfold exposure to electrostatic discharges with a potential, starting with the permissible one, then increasing it by not more than twice with number of exposures equal to accordingly 5, 4, 2, 1 of different polarity. By difference of noise intensity values on transitions, the potential reliability of compared transistor batches is identified.
EFFECT: non-destructive check of transistor batches by reliability criterion.
2 tbl, 1 dwg
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