FIELD: electronic engineering, possible use when manufacturing devices based on gallium arsenide.
SUBSTANCE: method for increasing radiation resistance of devices based on gallium arsenide includes manufacturing devices and performing thermal processing, after manufacture devices are irradiated with fast neutron fluence in interval ranging from 1·1013 neutron/cm2 to maximal fluence Fnmax, determined from formula neutron/cm2, where Fnmax - maximal values of neutron fluence; - allowed level of change of starting concentration of electrons in active area of device; n0, nF - concentration of electrons in active area of device before and after irradiation, respectively, cm-3; and after irradiation thermal processing is performed at temperature 200±20°C during 30-60 minutes.
EFFECT: increased resistance of devices based on gallium arsenide to irradiation by electrons and gamma-quanta.
1 dwg
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Authors
Dates
2007-08-20—Published
2006-04-17—Filed