FIELD: electronic engineering, possible use when manufacturing devices based on gallium arsenide.
SUBSTANCE: in the method for increasing radiation resistance of devices based on gallium arsenide, including manufacture of devices and performing of thermal processing, after manufacture devices are irradiated with a fluence of fast neutrons in range from 1·1013 neutron/cm2, to Fnmax, determined from formula neutron/cm2, where Fnmax - maximal value of neutron fluence; - allowed level of alteration of starting electron concentration in active zone of device; n0, nF - concentration of electrons in active area of device before and after irradiation, respectively cm-3; and after irradiation current training is performed in continuous power mode at a temperature of 85±5°C during 10-24 hours.
EFFECT: increased resistance of devices based on gallium arsenide to irradiation by electrons and gamma-quanta.
1 dwg
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Authors
Dates
2007-08-20—Published
2006-04-17—Filed