FIELD: physics.
SUBSTANCE: process of semiconductor device manufacturing in semiconductor structure provides improved quantum well intermixing in the desired parts of the device by forming of high-quality epitaxial layer on substrate, the layer featuring a quantum well; forming of second, low-quality flawed epitaxial layer over the high-quality layer; and thermal processing of the structure for obtaining of at least partial diffusion of flaws to the high-quality layer for intermixing of quantum wells in the structure. At that, flawed epitaxial layer is formed by change of original element ratio during growth beyond ideal or stoichiometrical conditions for obtaining crystal lattice flaws. Also a device manufactured by this process is offered.
EFFECT: quantum well intermixing at lower temperatures and improvement of the device characteristics.
22 cl, 12 dwg
Title | Year | Author | Number |
---|---|---|---|
METHOD OF QUANTUM WELLS MIXING WITHIN SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE STRUCTURE MADE ACCORDING TO THIS METHOD | 2003 |
|
RU2324999C2 |
METHOD FOR MANUFACTURING OPTICAL DEVICES | 2002 |
|
RU2291519C2 |
CONTACT FOR SEMICONDUCTOR LIGHT-EMITTING DEVICE | 2008 |
|
RU2491683C2 |
SEMICONDUCTOR STRUCTURE WITH ACTIVE ZONE (ALTERNATIVES) | 2005 |
|
RU2328795C2 |
PHOTON INTEGRATED CIRCUIT MANUFACTURING PROCESS | 2001 |
|
RU2240632C2 |
WAY OF REALISATION OF STRUCTURE OF MULTILAYERED PHOTO-ELECTRIC CONVERTER | 2008 |
|
RU2366035C1 |
METHOD FOR MANUFACTURING OPTICAL DEVICES AND APPROPRIATED DEVICES | 2002 |
|
RU2335035C2 |
METHOD FOR PRODUCING RESISTIVE CONTACT LAYER AND SEMICONDUCTOR DEVICE OF GROUPS II-VI | 1992 |
|
RU2151457C1 |
METHOD OF EPITAXIAL GROWTH OF INTERFACE BETWEEN MATERIALS FROM III-V GROUPS AND SILICON PLATE, WHICH PROVIDES NEUTRALIZATION OF RESIDUAL DEFORMATIONS | 2015 |
|
RU2696352C2 |
SEMICONDUCTOR LASER | 2008 |
|
RU2408119C2 |
Authors
Dates
2008-06-27—Published
2003-10-30—Filed