FIELD: processes; physics.
SUBSTANCE: method of producing photodiodes on crystals of indium antimonid of n-type conductivity includes preparation the wafer of initial indium antimonid crystal, generation of p-n pass by implantation beryllium ions with post-implantation annealing, application of protective and stabilise dielectric films and generating of contact combination. According to invention there are used wafers of initial indium antimonid crystal with impurity density 6·1013-2·1014 cm-3, implantation of beryllium ions is implemented at energy 20-40 keV and implantation dose (0.8 - 1.2)·1014 cm-3, post-implantation annealing is implemented fixed at temperature 350-375°C during 20-30 minutes with surface encapsulate film SiO2.
EFFECT: increasing of photodiodes current sensitivity.
1 tbl
Title | Year | Author | Number |
---|---|---|---|
METHOD FOR MANUFACTURING P-N-JUNCTIONS ON CRYSTALS OF INDIUM ANTIMONIDE HAVING N-TYPE CONDUCTANCE | 1993 |
|
RU2056671C1 |
METHOD FOR PRODUCING PHOTODIODES ON INDIUM ANTIMONIDE | 2006 |
|
RU2313853C1 |
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INDIUM ANTIMONIDE PHOTODIODE | 2006 |
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RU2324259C1 |
PROCESS OF MANUFACTURE OF PLANAR P - N JUNCTIONS ON INAS CRYSTALS OF N-TYPE CONDUCTIVITY | 1993 |
|
RU2045107C1 |
METHOD OF MANUFACTURE OF PLANAR LARGE AREA pin PHOTO DIODES ON HIGH-RESISTANCE p-SILICONE | 2013 |
|
RU2544869C1 |
METHOD FOR PRODUCING PHOTODIODES ON INDIUM ANTIMONIDE | 2006 |
|
RU2313854C1 |
METHOD FOR PRODUCING HYBRID PHOTODIODE ARRAY AROUND INDIUM ANTIMONIDE | 1994 |
|
RU2069028C1 |
Authors
Dates
2008-08-20—Published
2007-02-13—Filed