METHOD OF SORTING MICROCHIPS OF RANDOM ACCESS MEMORY AS TO UNINTERRUPTED OPERATION LEVEL Russian patent published in 2009 - IPC G01R31/28 

FIELD: information technologies.

SUBSTANCE: determination of integrity of the recorded test information and sorting of RAM microchips as to resistance to the effect of impulse ionising radiation (IIR) is performed during manufacture of microchips on all the products of the manufactured batch. At that, microchips are exposed to radiation not less than twice with impulse radiation of the laser simulating the effect of gamma-radiation as per the required uninterrupted operation level (UOL) with the following determination of integrity of the information pre-recorded to the microchip. As information code, there used are "diagonal" and "inverse diagonal" codes.

EFFECT: possibility of imitating impulse ionising radiation, performing the sorting of microchips of RAM as per Uninterrupted Operation Level parametre during the manufacturing process, and determining the actual UOL and operability of RC circuit in each cell and each certain RAM microchip as a whole to the effect of impulse ionising radiation.

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