HIGH-OHMIC POLYRESISTOR Russian patent published in 2009 - IPC H01C1/12 H01C7/00 

Abstract RU 2374708 C1

FIELD: physics.

SUBSTANCE: invention can be used as discrete devices, as well as a component when designing large and super large integrated circuits for various purposes. The polyresistor has a polysilicon area on a dielectric which insulates it from the substrate and components of the integrated circuit, high-alloyed areas of the resistor contacts, doped layer in the body of the resistor, obtained after metallisation, annealed at relatively low temperature (250°C to 850°C) and, therefore, with limited depth, which is less than thickness of the polysilicon layer.

EFFECT: proposed structure allows for obtaining large surface resistance of polyresistors with high accuracy.

6 dwg

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RU 2 374 708 C1

Authors

Leonov Nikolaj Ivanovich

Kotov Vladimir Semenovich

Lemeshevskaja Alla Mikhajlovna

Dudar' Natal'Ja Leonidovna

Sjakerskij Valentin Stepanovich

Emel'Janov Viktor Andreevich

Dates

2009-11-27Published

2008-08-01Filed