FIELD: electricity.
SUBSTANCE: in manufacturing method of multi-level copper metallisation of VLSIC, which involves application operations of metal and dielectric layers, photolithography and selective etching of those layers, chemical mechanical polishing of dielectric layers, to plate of silicium, which is coated with dielectric material with vertical conductors of underlying structure, which protrude on its surface, there applied is multi-layered conducting film consisting of adhesive barrier, etched and auxiliary layers; grooves are formed in auxiliary layer before etched layers by electrochemical method; copper horizontal conductors are grown inside grooves in open sections of etched layer till grooves are fully filled; the second auxiliary layer is applied to surface of plate, and in that layer holes are made to the surface of horizontal copper conductors; vertical copper conductors are grown by electrochemical method in open sections of horizontal conductors till holes for vertical conductors are fully filled; then, auxiliary layers are removed; conducting layers between horizontal copper conductors are removed; dielectric layers are applied to surface of the plate by smoothing and filling methods, and then dielectric material layers are removed above vertical conductors by means of chemical and mechanical polishing method.
EFFECT: improving quality of copper conductors.
16 cl, 11 dwg, 1 tbl
Title | Year | Author | Number |
---|---|---|---|
METHOD FOR MANUFACTURING OF IMPROVED MULTILEVEL COPPER METALLISATION USING DIELECTRICS WITH ULTRA LOW DIELECTRIC CONSTANT (ULTRA LOW-K) | 2011 |
|
RU2486632C2 |
METHOD FOR MANUFACTURING OF MULTILEVEL COPPER METALLISATION WITH ULTRALOW VALUE OF DIELECTRIC CONSTANT FOR INTRALAYER INSULATION | 2013 |
|
RU2548523C1 |
METHOD TO MANUFACTURE MULTI-LEVEL INTERCONNECTIONS OF INTEGRAL MICROCIRCUIT CHIPS WITH AIR GAPS | 2010 |
|
RU2436188C1 |
METHOD OF FORMATION OF MULTILEVEL METALLIZATION SYSTEM BASED ON TUNGSTEN FOR HIGH-INTEGRATED CIRCUITS | 2015 |
|
RU2611098C1 |
FORMING OF MULTILEVEL COPPER INTERCONNECTIONS OF MICRO IC WITH APPLICATION OF TUNGSTEN RIGID MASK | 2013 |
|
RU2523064C1 |
PRODUCTION OF CHIPS WITH HEAT SINK ELEMENTS FOR THROUGH SILICON VIAS OF MULTIPLE CHIP SUPER SSICS | 2013 |
|
RU2546710C2 |
PROCESS OF MANUFACTURE OF SELF-ALIGNED BUILT-IN COPPER METALLIZATION OF IN TEGRATED CIRCUITS | 2002 |
|
RU2230391C2 |
METHOD OF MAKING MULTILEVEL METALLISATION OF INTEGRATED MICROCIRCUITS WITH POROUS DIELECTRIC LAYER IN GAPS BETWEEN CONDUCTORS | 2011 |
|
RU2459313C1 |
ELECTROLYTE AND METHOD OF COPPER SEDIMENTATION ON THIN CONDUCTIVE SUBLAYER ON SURFACE OF SILICIC PLATES | 2012 |
|
RU2510631C1 |
METHOD OF FORMING COPPER DISTRIBUTION WITH A THICK COBALT-CONTAINING INSERT IN THE STRUCTURE OF DEVICES OPERATING BASED ON MAGNETIC TUNNEL JUNCTION | 2018 |
|
RU2694289C1 |
Authors
Dates
2011-06-10—Published
2010-01-11—Filed