FIELD: information technology.
SUBSTANCE: method of determining a set of parameters of a resistance based memory circuit involves selecting a first parameter based on a first predetermined design constraint of the resistance based memory circuit and selecting a second parameter based on a second predetermined design constraint of the resistance based memory circuit. The method further involves performing an iterative methodology to adjust at least one circuit parameter of a read amplifier portion of the resistance based memory circuit by selectively assigning and adjusting a physical property of the at least one circuit parameter to achieve a desired read amplifier margin value without changing the first parameter or the second parameter.
EFFECT: high efficiency of improving boundaries of the read amplifier.
41 cl, 24 dwg
