FIELD: electricity.
SUBSTANCE: method of obtainment of nonvolatile storage element includes creation of lower conductive electrode, buffer insulating layer, layer with resistive switching and upper conductive electrode. According to the method, contact of nanosized scale is created to layer with resistive switching by means of electrical moulding of structure. Buffer insulating layer and layer with resistive switching are made of binary oxides using low-temperature vacuum-deposition technique. Availability of contact of nanosized scale to layer with resistive switching localises switch area.
EFFECT: increasing relation of resistances in low-resistance and high-resistance state, stabilising switch parameters, reducing risk of structure degradation, increasing total quantity of switch cycles.
3 cl, 2 dwg
Title | Year | Author | Number |
---|---|---|---|
METHOD FOR PRODUCING ACTIVE STRUCTURE OF NON-VOLATILE RESISTIVE MEMORY ELEMENT | 2020 |
|
RU2749028C1 |
METHOD OF OBTAINMENT OF RESISTANCE STORAGE ELEMENT | 2013 |
|
RU2540486C1 |
METHOD FOR OBTAINING AN ACTIVE LAYER FOR A FORMLESS ELEMENT OF A NON-VOLATILE RESISTIVE MEMORY | 2021 |
|
RU2779436C1 |
METHOD FOR FORMING A SYNAPTIC MEMRISTOR BASED ON A NANOCOMPOSITE OF METAL-NONSTECHOMETRIC OXIDE | 2017 |
|
RU2666165C1 |
MIXED METAL OXIDE-BASED MEMRISTOR | 2013 |
|
RU2524415C1 |
METHOD OF CONTROLLING OPERATION OF A METAL-INSULATOR-SEMICONDUCTOR MEMBRANE CAPACITOR STRUCTURE | 2018 |
|
RU2706197C1 |
METHOD FOR FORMING MEMRISTIVE STRUCTURES BASED ON COMPOSITE OXIDES WITH NANOPARTICLE AGGLOMERATE | 2021 |
|
RU2767721C1 |
METHOD FOR OBTAINING ACTIVE LAYER OF NON-VOLATILE RESISTIVE MEMORY ELEMENT | 2023 |
|
RU2812881C1 |
ACTIVE LAYER OF MEMRISTOR | 2019 |
|
RU2711580C1 |
METHOD OF FORMING MEMRISTOR BASED ON SOLID-STATE ALLOY Si:Me AND MEMRISTOR STRUCTURE BASED ON SOLID-STATE ALLOY Si:Me | 2012 |
|
RU2540237C2 |
Authors
Dates
2012-11-27—Published
2011-04-07—Filed