METHOD FOR NON-DESTRUCTIVE DIAGNOSTICS OF INTEGRATED CIRCUITS Russian patent published in 2021 - IPC G01R31/30 

FIELD: measuring equipment.

SUBSTANCE: invention relates to measuring equipment and can be used for sorting integrated circuits (IC) according to the criterion of potential reliability. Essence: when studying a representative sample of IC, the frequency of rectangular pulses of the input voltage is set close to the limiting operating frequency of an IC of this type. The rise time of the output voltage is measured when the IC supply voltage changes from nominal to critical with a step of 0.2V at two temperatures: room temperature, close to 20°C, and elevated temperature, close to 100°C. Determine the dependence of the difference in the rise time of the output voltage pulses Δτ(U_sup), measured at the specified temperatures, on the supply voltage. ICs are rejected as potentially unreliable due to an increase in the pulse rise time difference Δτ(U_sup) by more than 10% of the value Δτ at the critical supply voltage.

EFFECT: increased efficiency and reliability of the division of IC into reliable and potentially unreliable.

1 cl, 1 ex, 4 dwg