METHOD OF PRODUCING POROUS SILICON Russian patent published in 2015 - IPC C30B31/22 C30B29/06 C01B33/02 B82B3/00 B82Y30/00 B82Y40/00 

Abstract RU 2547515 C1

FIELD: physics.

SUBSTANCE: method includes forming on the surface of an initial monocrystalline silicon substrate a layer of porous silicon via ion implantation of silver or cobalt ions with energy of 10-50 keV, a radiation dose which provides concentration of embedded metal atoms in the irradiated substrate of 3·1020-6·1023 atoms/cm3, current density of the ion beam of 2·1012-1·1014 ions/cm2 s with substrate temperature during irradiation of 20-400°C.

EFFECT: obtaining layers of porous silicon directly on the surface of monocrystalline silicon by ion implantation while excluding high-temperature annealing of the obtained articles from the process.

9 dwg, 3 ex

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Authors

Stepanov Andrej L'Vovich

Nuzhdin Vladimir Ivanovich

Valeev Valerij Ferdinandovich

Osin Jurij Nikolaevich

Dates

2015-04-10Published

2014-04-09Filed