FIELD: chemistry.
SUBSTANCE: method for doping semiconducting silicon with phosphorus is as follows. Semiconductor is placed into magnetic field. Silicon sheets are further treated with hydrofluoric acid (HF), boiled in ammonium-peroxide solution, washed with deionised water and dried by centrifuging; silicon sheets are placed into a preheated to T1=950°C diffusion furnace. Diffusion annealing is carried out for thirty minutes (t1=30 min) under oxygen (O2) while temperature increasing linearly to T2=1200°C. Two-stage isothermal annealing for thirty-fifty minutes (t2=30-50 min), for the first half of the time under the atmosphere of phosphorous pentoxide and nitrogen (P2O5+N2), for the second half - under oxygen (O2). Following the isothermal annealing the furnace is cooled for thirty minutes down to temperature T1. Silicon doping process in diffusion furnace requires as follows: oxygen (O2), fed into the quartz chamber - 45 l/h max, nitrogen - 650 l/h max. The p-n junction depth increased up to 15-19.3 micrometer.
EFFECT: improved chemical purity.
6 cl, 1 tbl, 1 dwg
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Authors
Dates
2017-03-02—Published
2015-10-21—Filed