FIELD: measuring equipment.
SUBSTANCE: invention can be used for measuring relative deformation. Essence of the invention consists in that the device comprises a flexible substrate from a strain-sensitive material, an upper flexible dielectric substrate, output conductors connected to contact pads on the upper flexible dielectric substrate in rows there are evenly located contact pads electrically connected to the lower substrate by needle contacts passing through the layer of electrical insulation, located between the substrates, wherein output conductors are located on outer surface of upper substrate.
EFFECT: high level of informativity of measurements, namely obtaining a representation of distribution of relative deformation (deformation field) over a considerable area of the surface of a loaded object, as well as measurement of deformation at any point and along any line of the test object.
1 cl, 3 dwg
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