FIELD: electrical engineering.
SUBSTANCE: invention can be used for production of high-integration semiconductor devices. Substance of invention consists in fact that in reactor of plasma treatment of semiconductor structures containing vacuum chamber with gas supply system and pumping system, substrate holder installed in area of base of vacuum chamber and connected to displacement unit HF, plasma generation system including a gas distributor and a plasma generator interconnected by connecting modules, each connecting module includes a thermomechanical stress compensation module installed between the gas distributor and the plasma generator.
EFFECT: improving reliability of the reactor.
6 cl, 4 dwg
Title | Year | Author | Number |
---|---|---|---|
DEVICE FOR PLASMA PROCESSING OF SEMICONDUCTOR STRUCTURES | 2019 |
|
RU2718132C1 |
REACTOR FOR PLASMA-CHEMICAL ETCHING OF SEMICONDUCTOR STRUCTURES | 2017 |
|
RU2678506C1 |
REACTIVE VAPOUR DOSING DEVICE | 2022 |
|
RU2800353C1 |
REACTOR FOR PLASMA PROCESSING OF SEMICONDUCTOR STRUCTURES | 2017 |
|
RU2670249C1 |
REACTOR FOR PLASMA-CHEMICAL TREATMENT OF SEMICONDUCTOR STRUCTURES | 2020 |
|
RU2753823C1 |
REACTOR FOR PLASMA TREATMENT OF SEMICONDUCTOR STRUCTURES | 1998 |
|
RU2133998C1 |
REACTOR FOR PLASMA TREATMENT OF SEMICONDUCTOR STRUCTURES | 2009 |
|
RU2408950C1 |
PROCESS OF PLASMA CHEMICAL REMOVAL OF FILMS OF PHOTORESIST | 1989 |
|
RU1653484C |
LOW-PRESSURE PLASMA-CHEMICAL REACTOR PROVIDING HIGH-DENSITY PLASMA FOR CARRYING OUT AN ETCHING AND DEPOSITION PROCESS | 2022 |
|
RU2797472C1 |
METHOD FOR PLASMA-CHEMICAL ETCHING OF HETEROSTRUCTURES BASED ON INP | 2019 |
|
RU2734845C1 |
Authors
Dates
2020-02-19—Published
2019-06-10—Filed