FIELD: materials science.
SUBSTANCE: invention relates to the field of materials science, in particular to the field of formation of dielectric coatings on the surface of indium antimonide (InSb) orientation (100) n-type conductivity, and can be used in the manufacture of semiconductor devices. The effect is achieved due to the fact that an additional layer of SiO2, formed by chemical vapor deposition, is added to the structure of the InSb substrate/anodic oxide (with preliminary sulfiding in solution) under the following modes: time, min, 5, deposition rate, nm/min .40; substrate holder temperature, °C, 135-150°C; RF power, W, 20; main and working pressure in the chamber, mTorr, 1228; SiH4/Ar (5%) 170; N2O 710.
EFFECT: creation of the SiO2/anodic oxide/InSb substrate structure, which has a high degree of mechanical and chemical protection, a low surface roughness (Ra 3 nm) and a fixed charge value NF 1×1012 cm-2.
1 cl, 1 tbl, 2 dwg
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Authors
Dates
2022-11-08—Published
2022-01-13—Filed