FIELD: measurement.
SUBSTANCE: present technical solution relates to determination of radiation resource of devices. Technical result is achieved due to the fact that first the p-i-n diode forward current density is determined from voltage to radiation effects, then, the p-i-n diode forward current density is recorded with an increase in the level of ionizing radiation, the level of ionizing radiation is recorded, at which forward voltage corresponding to forward current density of p-i-n diode j0for, defined by expression (2⋅m⋅k⋅T⋅M⋅τ⋅Kτ⋅σ2)/(q⋅Wb⋅(dσ/dΦ)), stops decreasing and its growth is fixed, and this value is selected as a criterion of decreasing resource of devices requiring their replacement to ensure failure-free operation of equipment.
EFFECT: determination of radiation resource of devices during operation in fields of ionizing radiation, in order to prevent uncontrolled failures and ensure failure-free operation in fields of ionizing radiation.
1 cl, 1 dwg
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Authors
Dates
2024-04-23—Published
2024-02-06—Filed