FIELD: measurement technology.
SUBSTANCE: invention relates to methods of determining resonant high-order Mie mode. Method for determining resonant Mie mode of high order at superresonance in a spherical dielectric homogeneous particle, consists in making a spherical dielectric particle from a transparent material for the used radiation, irradiating a dielectric particle with laser radiation with a flat wave front, determining superresonance of high-order Mie modes by the level of the maximum signal at different wavelengths, wherein the spherical dielectric particle is made from a material with a relative refraction index of not more than 2, with a diameter D of not less than 10 λ/pi and is determined on the outer surface layer inside the dielectric sphere in the region of the sphere poles along the direction of propagation of high-order Mie mode radiation at superresonance from the condition of superresonance localization at achievement of global minimum moduli of partial coefficients Mie (cl, dl) for spherical dielectric homogeneous particle.
EFFECT: fast determination of resonant Mie mode of high order at superresonance in spherical mesoscale dielectric homogeneous particle.
1 cl, 7 dwg
