FIELD: microelectronics. SUBSTANCE: method involves formation of varying-width conductors on semiconductor substrate with active and passive components, deposition of dielectric film, h≥ 2.5 d thick, where d is conductor thickness, etching of dielectric film by using liquid method through depth equal to conductor thickness, removal of photoresist, and repeated etching of dielectric film through depth equal to conductor thickness using liquid method or proceeding in two stages for etching dielectric film: first stage involves HF magnetron etching through depth of 0.25 to 0.30 micron and second stage, liquid etching. EFFECT: improved smoothness of integrated circuit surface. 3 cl, 4 dwg
Title | Year | Author | Number |
---|---|---|---|
PROCESS OF MANUFACTURE OF TWO-LEVEL COATING | 1991 |
|
RU2025825C1 |
METHOD OF METALLIZING INTEGRATED CIRCUITS | 1987 |
|
SU1477175A1 |
METHOD FOR MANUFACTURING OF SEMICONDUCTOR INSTRUMENTS | 1997 |
|
RU2131631C1 |
MANUFACTURING METHOD OF MULTI-LEVEL COPPER METALLISATION OF VLSIC | 2010 |
|
RU2420827C1 |
METHOD FOR MANUFACTURING PROGRAMMABLE MEMBERS | 2003 |
|
RU2263370C2 |
METHOD FOR FORMING CONTACT WINDOWS IN THE LAYER OF THE PROTECTIVE FOUNDATION OF A HIGH-VOLTAGE DEVICE | 2016 |
|
RU2645920C2 |
METHOD OF MANUFACTURE OF FIELD-EFFECT TRANSISTORS ON THE BASE OF GALLIUM ARSENIDE | 0 |
|
SU1831731A3 |
METHOD OF PRODUCING MULTILAYER RADIOELECTRONIC COMPONENTS | 2023 |
|
RU2826900C1 |
METHOD FOR PRODUCING BIPOLAR-TRANSISTOR INTEGRATED CIRCUITS | 1988 |
|
SU1538830A1 |
METHOD FOR MANUFACTURING OF IMPROVED MULTILEVEL COPPER METALLISATION USING DIELECTRICS WITH ULTRA LOW DIELECTRIC CONSTANT (ULTRA LOW-K) | 2011 |
|
RU2486632C2 |
Authors
Dates
1994-08-15—Published
1990-07-12—Filed