METHOD OF SILICON DIOXIDE FILM FORMATION Russian patent published in 1996 - IPC

Abstract SU 1820781 A1

FIELD: protective coatings. SUBSTANCE: invention relates to a method of formation of silicon dioxide films including blowing through of reactor with oxygen and deposition of silicon dioxide film from silicon compound-containing gas phase onto silicon carriers at 650-770 C under reduced pressure. Defectiveness of the film is lowered when reactor is blown through with oxygen mixed with 2-6 vol % of ozone under 5-60 Pa pressure for 3-10 min. EFFECT: improved quality of films.

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SU 1 820 781 A1

Authors

Turtsevich A.S.

Krasnitskij V.Ja.

Kozlov A.L.

Kabakov M.M.

Petrovich N.P.

Viskup A.P.

Dates

1996-07-27Published

1990-04-17Filed