FIELD: designing semiconductor voltage limiters having low dynamic resistance. SUBSTANCE: proposed device has n identical series-connected low-voltage symmetrical p-n-p or n- p-n voltage limiters whose quantity (n) is found from expression , where UBRmin/o is minimal breakdown voltage of device; rr.d.l is dynamic resistance of single-component voltage limiter with minimal breakdown voltage equal to UBRmin/o; IRSM is maximal permissible amplitude of nonrepetitive reverse pulsed current that can be passed through voltage limiter during its operation; Uperm is maximal permissible voltage that can be built up across voltage limiter when it carries current IRSM.. Minimal breakdown voltage UBRmin of each on n series-connected low-voltage symmetrical p-n-p or n-p-n voltage limiters is found in this case from expression . EFFECT: reduced dynamic resistance of high- voltage symmetrical voltage limiters. 1 cl, 3 dwg
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Authors
Dates
2003-09-27—Published
2002-04-01—Filed