FIELD: instrument engineering.
SUBSTANCE: invention is designed for use in manufacturing technology and design of the wide range of microelectronic devices. The sensitive element consists of a monocrystal silicon base member, a two-layer membrane including the Si3N4 layer and the compensation AlN layer, with predominant orientation of the <0001> texture axis along the normal line to the membrane surface, positioned above the opening in the base member forming an under-membrane chamber (UMC), and the information signal reading unit. Correlation between the depths of the Si3N4 and the AlN layers is inversely proportional to the in-built mechanical stress. Sensitive elements are manufactured by pyrolytic coating of the base member silicon nitride layer surface with a silane-containing substance, mainly dichlorosilane, in the ammonia atmosphere with the use of the SiO2 sublayer; then the compensation coating layer is added by high-frequency magnetron spraying and subsequent UMC formation on the back side of the base member in two stages: first, by the liquid anisotropic etching of the base member material at the UMC location, then, after adding the compensation layer, during the second stage of the UMC formation - by liquid anisotropic etching of the bottom of the newly formed blind hole in the base member - down to the silicon nitride layer.
EFFECT: widening the variety of materials used for the compensation layer, as well as the functional capabilities of the entire product item.
5 cl, 3 dwg, 4 tbl, 3 ex
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Authors
Dates
2008-06-20—Published
2007-04-16—Filed