SEMICONDUCTOR DEVICE PERIPHERY, NEUTRALISING EFFECT OF CHARGE ON STABILITY OF RETURN LEAKAGE AND BREAKDOWN VOLTAGE Russian patent published in 2010 - IPC H01L29/866 

Abstract RU 2379786 C1

FIELD: physics; semiconductors.

SUBSTANCE: invention relates to power semiconductor devices, specifically to high-voltage semiconductor devices. The semiconductor device periphery has a peripheral annular P-N junction, coated with a dielectric film and surrounded under the dielectric film by a spiral electroconductive film with Zener diodes, with the ends of the spiral connected to P- and N- regions of the junction on the surface of the semiconductor device. The spiral of the electroconductive film with Zener diodes has distance between turns selected based on a given condition.

EFFECT: neutralisation of effect of charge on stability of return leakage and breakdown voltage.

6 cl, 1 dwg

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RU 2 379 786 C1

Authors

Bubukin Boris Mikhajlovich

Kastrjulev Aleksandr Nikolaevich

Rjazantsev Boris Georgievich

Dates

2010-01-20Published

2008-09-02Filed