METHOD OF MAKING SILICON STRUCTURE ON INSULATOR Russian patent published in 2011 - IPC H01L21/76 

Abstract RU 2412504 C1

FIELD: chemistry.

SUBSTANCE: in the method of making a silicon structure on an insulator by joining two silicon wafers, one of which has an insulating layer on the working surface, the insulating layer on the working surface of the first wafer has an etched out contour on its edge, and a layer of material is deposited on the edge of the working surface of the second wafer, where the said layer has the same shape and size of the etched out region on the firs wafer and enables to attach the wafers together when they are brought into contact during thermal treatment.

EFFECT: less defects and high quality of silicon films on an insulator owing to preservation of quality of the starting material.

7 dwg

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RU 2 412 504 C1

Authors

Krasnikov Gennadij Jakovlevich

Tadevosjan Samvel Grantovich

Ranchin Sergej Olegovich

Shelegeda Andrej Grigor'Evich

Dates

2011-02-20Published

2009-07-06Filed