FIELD: electronics.
SUBSTANCE: use: for sorting system-on-chip IC according to the criterion of potential reliability. Essence of the invention lies in the fact that in a representative sample of system-on-chip IC, the values of critical supply voltages (CSV) are measured separately for each IC functional unit at different temperatures (for example, at 25 °C, 50 °C, 75 °C and the upper temperature allowed for this class of ICs), graphs of averaged over the sample dependencies of the values of CSV from the temperature for each functional unit are constructed. IC is referred to as reliable or potentially unreliable according to the degree of deviation of the individual temperature dependences of CSV functional blocks of the IP from averaged over the sample.
EFFECT: providing opportunities to improve the efficiency of the method.
1 cl, 1 dwg, 1 tbl
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