METHOD FOR NON-DESTRUCTIVE QUALITY CONTROL OF SUPER-LARGE-SCALE INTEGRATED CIRCUITS BASED ON CRITICAL VOLTAGE VALUE Russian patent published in 2019 - IPC G01R31/30 G01R31/303 

FIELD: electricity.

SUBSTANCE: invention relates to microelectronics and can be used to ensure quality and reliability of ultra-large integrated circuits (ULIC). Essence: critical supply voltage is measured at normal and elevated temperature. ULIC software is preliminary programmed by a testing program for separate diagnostics of ULIC units. Critical supply voltage of the selected unit is measured by supplying single timing pulses at low supply voltage and outputting the result through the input/output unit at normal supply voltage. For representative sampling of ULIC, dependence of critical supply voltage on temperature in range 10÷85 °C is measured. Dependent on the curve is an information area limited by a straight line corresponding to the minimum operating voltage according to the specifications for this type of ULIC, and the curve of the measured dependence of the critical supply voltage on temperature. According to the area of this informative area, reliability of ULIC is evaluated.

EFFECT: technical result is possibility of controlling the quality and reliability of programmable ULIC type microcontrollers and microprocessors.

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