FIELD: physics.
SUBSTANCE: in the process of increasing the docking strength of the indium microcontacts LSI and MFS by squeezing the indium microcontacts located in the docked crystals, the microcontacts in both crystals are carried out in the form of the elongated rectangles arranged at the angle against each other, a plurality of rectangular microcontacts is formed on the matrix periphery in each crystal, which is combined in grids and create reference indium microcontacts of a large area.
EFFECT: increasing the docking strength of the indium microcontacts.
5 dwg
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