FIELD: computer technology.
SUBSTANCE: method for reading the state of a magneto-resistive memory cell with STT-MRAM spin transfer consists in generating a Vrd reading signal during the Trd time of reading the memory cell. The Vrd signal voltage in a given time range T2 falls periodically below the set value of the stabilization pulse Vlo, and in a given time range T1 reaches a Vhi value that is higher than the Vlo value.
EFFECT: reduced probability of reading perturbation.
14 cl, 11 dwg
Authors
Dates
2021-04-09—Published
2020-06-30—Filed