FIELD: semiconductor industry.
SUBSTANCE: invention relates to the field of semiconductor device manufacturing technology, in particular to the technology of manufacturing contacts with low resistance. The method for manufacturing contacts includes applying a titanium film to a p-Si substrate, followed by low-temperature treatment at a temperature of 650°C for 30 seconds in a nitrogen N2 stream and followed by high-temperature treatment, while according to the invention, a TiNxOy/TiSi contact is formed on a p-Si substrate by applying a 70 nm thick Ti film at a speed of 0.5 nm/c, at a substrate temperature of 450°C, a pressure of 10-5 Pa, followed by low-temperature treatment in a nitrogen stream of N2 at 200 cm3/min, and the subsequent high-temperature treatment is carried out at a temperature of 950-1050°C for 10 seconds in an atmosphere of ammonia NH3.
EFFECT: invention provides an opportunity to improve reliability and increase the percentage of yield of suitable devices.
1 cl, 1 tbl
Title | Year | Author | Number |
---|---|---|---|
METHOD FOR PRODUCTION OF TITANIUM SILICIDE | 2020 |
|
RU2751983C1 |
METHOD FOR MANUFACTURING OF SHALLOW JUNCTIONS | 2020 |
|
RU2748335C1 |
METHOD FOR FORMING FIELD-EFFECT TRANSISTORS | 2022 |
|
RU2791268C1 |
METHOD OF MAKING CONTACTS | 2023 |
|
RU2824474C1 |
METHOD FOR MANUFACTURING A SEMICONDUCTOR APPARATUS | 2020 |
|
RU2756003C1 |
METHOD OF PRODUCING SILICON NITRIDE | 2016 |
|
RU2629656C1 |
METHOD FOR SEMICONDUCTOR DEVICE FABRICATION | 2008 |
|
RU2433501C2 |
SILICON NITRIDE MANUFACTURING METHOD | 2021 |
|
RU2769276C1 |
METHOD FOR MAKING SEMICONDUCTOR DEVICE | 2017 |
|
RU2661546C1 |
METHOD OF MAKING NICKEL SILICIDE | 2020 |
|
RU2734095C1 |
Authors
Dates
2022-05-23—Published
2021-09-03—Filed