FIELD: semiconductor devices.
SUBSTANCE: method of manufacturing involves providing a substrate; forming on the substrate a plurality of first structures extending in a first direction; formation of a sacrificial layer on the side surface of each of the first structures; forming an outer separation layer on the side surface of each sacrificial layer; removing portions of each outer separation layer to obtain structured outer separation layers so as to expose portions of each sacrificial layer; and removal of sacrificial layers to form air gaps between structured outer separation layers and first structures.
EFFECT: invention discloses a method of making a semiconductor device and a semiconductor device.
15 cl, 15 dwg
Title | Year | Author | Number |
---|---|---|---|
SEMICONDUCTOR STRUCTURE AND METHOD OF ITS MANUFACTURE | 2021 |
|
RU2808029C1 |
SEMICONDUCTOR STRUCTURE AND METHOD OF ITS MANUFACTURE | 2021 |
|
RU2807501C1 |
SEMICONDUCTOR STRUCTURE AND METHOD OF ITS MANUFACTURING | 2021 |
|
RU2817107C1 |
SEMICONDUCTOR STRUCTURE AND METHOD OF ITS MANUFACTURE | 2021 |
|
RU2808084C1 |
PROCESS OF MANUFACTURE OF SEMICONDUCTOR DEVICES | 1989 |
|
SU1702825A1 |
SEMICONDUCTOR STRUCTURE AND METHOD OF ITS MANUFACTURE | 2022 |
|
RU2810689C1 |
VERTICAL STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD OF FORMATION THEREOF | 2005 |
|
RU2338683C2 |
DEVICE BASED ON CARBON-CONTAINING COLD CATHODES ARRANGED ON SEMICONDUCTOR SUBSTRATE, AND METHOD OF MAKING SAME | 2014 |
|
RU2579777C1 |
METHOD FOR PRODUCING SEMICONDUCTOR MEMORY DEVICE (ALTERNATIVES) AND SEMICONDUCTOR MEMORY DEVICE | 1998 |
|
RU2234763C2 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | 1997 |
|
RU2176423C2 |
Authors
Dates
2024-02-28—Published
2021-06-22—Filed