FIELD: microelectronics. SUBSTANCE: for manufacture of microcircuits diffusion regions of p-type with depth xp are formed in semiconductor silicon substrate of n-type of conduction. Then grooves xk deep isolating these regions are created as well as regions of n-type in substrate. Dielectric film is grown and polysilicon is deposited on surface of grooves. Manufactured structure is tapered off by removal of material of substrate to opening of isolated pockets. Isolated pockets containing p-type regions are diffused with p-type dope to depth of x. Transistor structures of n-p-n type are formed in n-type pockets, p-n-p structures with depth xδ of base regions are formed in p-type pockets. Dimensional parameters of diffusion regions of p-n-p transistors should satisfy relation xk-x≅xp≅xk-xδ. This results in stable and increased values of breakdown voltages between collectors and emitters of transistors as well as their gain factor. EFFECT: raised output of good microcircuits thanks to increase of reproduction of parameters of distribution of dope in p-n-p transistor structures. 4 dwg
Title | Year | Author | Number |
---|---|---|---|
METHOD OF MAKING SELF-ALIGNED HIGH-VOLTAGE INTEGRATED TRANSISTOR | 2012 |
|
RU2492546C1 |
MANUFACTURING METHOD OF SHF POWERFUL FIELD LDMOS TRANSISTORS | 2008 |
|
RU2364984C1 |
DIELECTRIC-ISOLATED INTEGRATED CIRCUIT MANUFACTURING PROCESS | 1991 |
|
RU2024108C1 |
PROCESS OF MANUFACTURE OF TRANSISTOR STRUCTURES WITH DIELECTRIC INSULATION | 1989 |
|
SU1702826A1 |
POWERFUL MICROWAVE LDMOS TRANSISTOR AND METHOD OF ITS MANUFACTURING | 2011 |
|
RU2473150C1 |
PROCESS OF MANUFACTURE OF MICROCIRCUITS WITH DIELECTRIC INSULATION OF ELEMENTS | 1990 |
|
SU1686982A1 |
METHOD OF MAKING TRANSISTOR MICROWAVE LDMOS STRUCTURE | 2012 |
|
RU2515124C1 |
HIGH-VOLTAGE SELF-ALIGNED INTEGRATED DIODE | 2012 |
|
RU2492552C1 |
HIGH-VOLTAGE SELF-ALIGNED INTEGRATED TRANSISTOR | 2012 |
|
RU2492551C1 |
METHOD OF MANUFACTURING OF POWERFUL SILICON SHF LDMOS TRANSISTORS WITH MODERNIZED GATE NODE OF ELEMENTARY CELLS | 2016 |
|
RU2639579C2 |
Authors
Dates
1994-02-15—Published
1989-01-13—Filed