FIELD: semiconducting technology, photodetectors. SUBSTANCE: C-structure is prepared by method of liquid-phase epitaxy. Firstly, backing InP is annealed at 300 ± 10 C, then - at temperature above or equal epitaxy temperature under protective plate InP. Epitaxy process is carried out at 710 + 10 C. Layers of the general formula Jn0,53Ga0,47As are obtained with carrier concentration n < 1·1015 cm-3 showing increased photosensitivity at spectral range 1.85-2.1 microns. EFFECT: improved method of structure making. 2 cl, 3 ex, 1 dwg
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Authors
Dates
1994-09-30—Published
1989-10-30—Filed