FIELD: electronics. SUBSTANCE: eperaxial layer, layer of undoped solid solution of compound A3B5, layer of compound A3B5 of opposite type of conductance relative to first layer A3B5 and contact layer are precipitated in sequence on substrate A3B5, local ohmic contacts and barrier region to at least one of surface of structure as well as ohmic contacts to p- and n- regions of structure are formed. Barrier regions are formed from zinc selenide with specific resistance 105-1010 Ohm.cm precipitated by method of vacuum-thermal sputtering at substrate temperature 70-400 C. EFFECT: decreased threshold current and enhanced differential quantum efficiency due to diminished leakage currents. 2 cl
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Authors
Dates
1996-11-27—Published
1983-03-04—Filed