METHOD FOR ESTIMATING QUALITY OF ANODIC OXIDE IN THE COURSE OF ITS GROWTH Russian patent published in 1995 - IPC

Abstract SU 1783934 A1

FIELD: semiconductor instrumentation engineering. SUBSTANCE: on-line monitoring of anodic oxide quality involves measurement of autocorrelation function of current noise while applying d.c. voltage to semiconductor-oxide-electrolyte system. Oxide quality is estimated by presence of section with negative value of measured quantity on measured curve. EFFECT: reduced time of estimation of anodic oxide quality. 2 dwg

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SU 1 783 934 A1

Authors

Birjukov V.N.

Gat'Ko L.E.

Sorokin I.N.

Dates

1995-12-27Published

1990-06-02Filed